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论文:2013,Vol:31,Issue(4):660-663 |
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引用本文： |
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蒋泽军, 秦楠, 李艳艳. 一种提高固态盘可靠性的设计方法[J]. 西北工业大学 |
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Jiang Zejun, Qin Nan, Li Yanyan. Proposing a Design Model for Improving Reliability of Solid Disk (SSD)[J]. Northwestern polytechnical university |
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| 一种提高固态盘可靠性的设计方法 |
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| 蒋泽军, 秦楠, 李艳艳 |
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| 西北工业大学 计算机学院, 陕西 西安 710072 |
| 摘要: |
| 提出了一种LS-RAID(Logic-level Striping Redundant Array of Independent Disks)固态盘(Solid State Disk,SSD)设计模型。在单个闪存芯片内,该模型在逻辑层实现了条带化,并将校验信息按照RAID5机制分配到逻辑闪存芯片中,从而提高了固态盘可靠性。使用DiskSim进行仿真测试,表明该模型在提高可靠性的同时,对固态盘平均寿命和损耗均衡影响不大,具有实用价值。 |
| 关键词:
校验信息
固态盘
条带化
可靠性
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| Proposing a Design Model for Improving Reliability of Solid Disk (SSD) |
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| Jiang Zejun, Qin Nan, Li Yanyan |
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| Department of Computer Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, China |
| Abstract: |
| We propose a design model of Logic-level Striping Redundant Array of Independent Disks.In a single flash chip, the model implements striping in logic-level and assigns the parity information to the logic flash memory chips according to the RAID5 mechanism.It aims to improve SSD reliability.Here we use DiskSim to estimate the design model.Simulation results and their analysis show preliminarily that the reliability of SSD is indeed improved at the cost of a little effect on the average life of the SSD and the wear leveling. |
| Key words:
computer simulation
computer software
design
estimation
flash memory
mathematical models
microprocessor chips
NAND circuits
reliability analysis
LS-RAID(Logic-level Striping Redundant Array of Independent Disks)
parity information
solid state disk(SSD)
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| 收稿日期: 2012-10-10
修回日期:
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| DOI: |
| 基金项目: 航空科学基金(2012ZC53040);西北工业大学2011届本科生毕业设计重点扶持项目资助 |
| 通讯作者:
Email： |
| 作者简介: 蒋泽军(1964-),西北工业大学教授,主要从事存储系统及云计算等技术研究。
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| 相关功能 |
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| 作者相关文章 |
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| 蒋泽军 在本刊中的所有文章 |
| 秦楠 在本刊中的所有文章 |
| 李艳艳 在本刊中的所有文章 |
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参考文献: |
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