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论文:2015,Vol:33,Issue(5):716-720 |
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引用本文： |
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周国昌, 赖晓玲, 朱启, 巨艇, 于登云, 郭阳明. 一种改进的基于时钟沿的单粒子翻转自检纠错方法[J]. 西北工业大学学报 |
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Zhou Guochang, Lai Xiaoling, Zhu Qi, Ju Ting, Yu Dengyun, Guo Yangming. An Improved Error Detection and Correction Method for Single Event Upset with Clock Edge[J]. Northwestern polytechnical university |
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| 一种改进的基于时钟沿的单粒子翻转自检纠错方法 |
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| 周国昌1, 赖晓玲1, 朱启1, 巨艇1, 于登云3, 郭阳明2 |
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1. 中国空间技术研究院 西安分院, 陕西 西安 710072;
2. 西北工业大学 计算机学院, 陕西 西安 710072;
3. 中国航天科技集团公司科技委, 北京 100048 |
| 摘要: |
| 通过将数据与时钟的转变沿进行对比,检验其是否同步,设计了一种改进的基于时钟沿的单粒子翻转自检纠错电路结构,来实现数据翻转错误的检测和纠正。该电路在保持原有电路优点的同时,克服了原电路的不足,既可完成上升沿和下跳沿错误检测,又可以同时实现多位SEU错误的检测纠正。仿真和实际应用均表明,所提出的改进电路是一个有实用价值的检错纠错电路。 |
| 关键词:
超大规模集成电路
单粒子翻转
时钟沿
自检纠错
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| An Improved Error Detection and Correction Method for Single Event Upset with Clock Edge |
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| Zhou Guochang1, Lai Xiaoling1, Zhu Qi1, Ju Ting1, Yu Dengyun3, Guo Yangming2 |
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1. Academy of Space Technology (Xi'an Branch), Xi'an 710100, China;
2. Department of Computer Science and Engering, Northwestern Polytechnical University, Xi'an 710072, China;
3. The Science and Technology Committee, China Aerospace Science and Technology Corp., Beijing 100048, China |
| Abstract: |
| Based on the clock edge, an improved error detection and correction (EDAC) circuit for single event upset (SEU) is proposed in this paper. The circuit can implement the data error detection and correction through determining whether the data and clock are asynchronous or not. It keeps the advantages and overcomes the shortcomings of the EDAC circuit and it can not only complete detection under clock rising or falling edge but also achieve multi-bit SEU error detection and correction. The simulation results and their analysis show preliminarily that the proposed improved EDAC circuit is indeed better. |
| Key words:
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| 收稿日期: 2015-04-28
修回日期:
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| DOI: |
| 基金项目: 国家自然科学基金(61371024)、航空科学基金(2013ZD53051)、航天支撑技术基金及中航产学研项目(Cxy2013XGD14)资助 |
| 通讯作者:
Email： |
| 作者简介: 周国昌(1978—),高级工程师、博士,主要从事计算机体系结构星载ASIC设计研究。
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| 相关功能 |
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| 作者相关文章 |
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| 周国昌 在本刊中的所有文章 |
| 赖晓玲 在本刊中的所有文章 |
| 朱启 在本刊中的所有文章 |
| 巨艇 在本刊中的所有文章 |
| 于登云 在本刊中的所有文章 |
| 郭阳明 在本刊中的所有文章 |
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参考文献: |
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[4] Ruano O, Reviriego P, Maestro J A. A New EDAC Technique against Soft Errors Based on Pulse Detectors[C]//The Proceedings of IEEE International Symposium on Industrial Eletronics, 2009:2293-2298
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